If you are in search of Idi Technology computer memory parts, the team at ASAP Memory can supply you with whatever components you need. We carry 100559-J-S, S-100-K-8-G, S-075-UST-10-G-S, S-075-SP-3-G-S, S-100-J-2-G, as well as other parts of computer and storage devices. Our team stocks a diverse catalogue of computer components as well as parts pertaining to Integrated Circuits from Idi Technology. Because we offer such a diverse supply of new and obsolete segments, we are able to meet the needs of our clients, whether it's a commonly requested part or a small unique item. Call us now and see how we can help you.
Part No | Memory Type | Description | QTY | RFQ |
---|---|---|---|---|
100559-J-S | integrated circuits | test probes sngle end .30 ctr w/o flange, serrated.. | Available | RFQ |
S-100-K-8-G | integrated circuits | test connectors 4 sided chisel.. | Available | RFQ |
S-075-UST-10-G-S | integrated circuits | test probes 4 pt tapered crown steel.. | Available | RFQ |
S-075-SP-3-G-S | integrated circuits | test probes headless chsld spear steel.. | Available | RFQ |
S-100-J-2-G | integrated circuits | test connectors headless radius.. | Available | RFQ |
SSX-75-E-4.9-G-D/C | integrated circuits | test probes headed 90 deg convex improve pt accuracy.. | Available | RFQ |
100445-ES-F-N-12-AM | integrated circuits | test probes sngle ended coaxial .20 ctr 12 sma mle.. | Available | RFQ |
S-075-H-5-G-1.21-OAL | integrated circuits | test probes headed serrated.. | Available | RFQ |
100445-ES-F-N-12-NC | integrated circuits | test probes sngle ended coaxial .20 ctr 12 no conn.. | Available | RFQ |
SS-4-7-G-S/C-W/HOLE-.385-OAL | integrated circuits | test probes headed 37 deg 3sidechslw/hole.385.. | Available | RFQ |
SX-1-H-6.6-G-D/C | integrated circuits | test probes headed serrated improve pt accuracy.. | Available | RFQ |
ICT-100-U-6.7-G-S-S/C | integrated circuits | test probes .10 ctr 3 amp probe 4 pt crwn steel.. | Available | RFQ |
S-100-U-10-D-S | integrated circuits | test probes headless 4pt crown steel.. | Available | RFQ |
SX-1-D-2-G-D/C | integrated circuits | test probes headed radius improve pt accuracy.. | Available | RFQ |
S-1-U-3.8-G-W/L-D/C-.670-OAL | integrated circuits | test probes headless 4 pt crwn.. | Available | RFQ |
S-075-J-3-G | integrated circuits | test probes headless spherical.. | Available | RFQ |
S-1-H-6.6-D-D/C-.670-OAL | integrated circuits | test probes headed serrated.. | Available | RFQ |
SS-75-B-2.4-G-D/C-.620-OAL | integrated circuits | test probes hdless 30 deg spear .620 length.. | Available | RFQ |
S-3-E-7-G-S/C-SS-SPGS | integrated circuits | test probes headed 90 deg convex stainless steel spgs.. | Available | RFQ |
100445-B-F-N-36-AM | integrated circuits | test probes sngle ended coaxial .20 ctr 36 sma mle.. | Available | RFQ |
ICT-075-SW-7-G-S-S/C | integrated circuits | test probes .075' ctr 3amp probe 4 side arrw steel.. | Available | RFQ |
ICT-075-NT-7-G-S-S/C | integrated circuits | test probes .075' ctr 3amp probe needle teeth steel.. | Available | RFQ |
SX-1-K-3.8-D-D/C | integrated circuits | test probes headed 45 deg 4 side chisel imprv pt acc.. | Available | RFQ |
RX-0-WW-016-RXSS50WW | integrated circuits | test connectors improved pt accuracy wire wrap .016 sq.. | Available | RFQ |
S-2-D-8.3-G-D/C | integrated circuits | test probes headed radius.. | Available | RFQ |
S-00-G-1.6-D-D/C | integrated circuits | test probes headless concave.. | Available | RFQ |
S-100-HL-8-G | integrated circuits | test connectors headed serated.. | Available | RFQ |
100746-ES-F-N-12-BF | integrated circuits | test probes sngle end w/ cable .20 ctr 12 smb fm.. | Available | RFQ |
100445-B-F-S-12-AF | integrated circuits | test probes sngle ended coaxial .20 ctr 12 sma fe.. | Available | RFQ |
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